The scanning electron microscopy hardware consists
of a variable pressure JEOL model “5900LV” equipped with a
large specimen chamber, a 5-axis computer-controlled stage, BEI
and SEI detectors, a Noran EDS detector for elements, Z>=4, and a
CCD camera for electron back-scattered diffraction
(“EBSD”).
Software includes JEOL digital image processing
software, the Noran Vantage system for elemental mapping and analysis,
and the Noran EBSD software.
